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Scanning Electron Microscopy and X-Ray Microanalysis



Scanning Electron Microscopy and X-Ray Microanalysis, CIENCIAS EXATAS, Springer Nature


Sinopse

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects
of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover
SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Metadado adicionado por UmLivro em 28/12/2024

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Metadados adicionados: 28/12/2024
Última alteração: 27/12/2024

Autores e Biografia

Goldstein, Joseph (Autor)

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